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IEEE Instrumentation & Measurement Magazine > 2017 > 20 > 6 > 62 - 66
TENCON 2017 - 2017 IEEE Region 10 Conference > 1415 - 1420
TENCON 2017 - 2017 IEEE Region 10 Conference > 421 - 426
TENCON 2017 - 2017 IEEE Region 10 Conference > 822 - 825
TENCON 2017 - 2017 IEEE Region 10 Conference > 602 - 607
TENCON 2017 - 2017 IEEE Region 10 Conference > 591 - 596
TENCON 2017 - 2017 IEEE Region 10 Conference > 585 - 590
TENCON 2017 - 2017 IEEE Region 10 Conference > 280 - 284
TENCON 2017 - 2017 IEEE Region 10 Conference > 2504 - 2509
TENCON 2017 - 2017 IEEE Region 10 Conference > 2521 - 2525
TENCON 2017 - 2017 IEEE Region 10 Conference > 2494 - 2499
TENCON 2017 - 2017 IEEE Region 10 Conference > 2291 - 2296
TENCON 2017 - 2017 IEEE Region 10 Conference > 2747 - 2752
TENCON 2017 - 2017 IEEE Region 10 Conference > 2683 - 2686
TENCON 2017 - 2017 IEEE Region 10 Conference > 2426 - 2430
TENCON 2017 - 2017 IEEE Region 10 Conference > 1907 - 1912
TENCON 2017 - 2017 IEEE Region 10 Conference > 1843 - 1846
TENCON 2017 - 2017 IEEE Region 10 Conference > 2035 - 2040
TENCON 2017 - 2017 IEEE Region 10 Conference > 1806 - 1811
TENCON 2017 - 2017 IEEE Region 10 Conference > 1544 - 1549